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Development of high density plasma assisted sputtering source for high growth rate deposition process

机译:用于高生长速率沉积工艺的高密度等离子体辅助溅射源的开发

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摘要

High speed deposition method was investigated by a high density plasma assisted sputtering source (HiPASS). The HiPASS used a hollow cathode discharge (HCD) gun (maximum current: 60 A) as a high density plasma source. The extracted high density plasma from the HCD gun was transported to the magnetron sputtering region by a magnetic field. In the magnetron sputtering discharge, the transported plasma reduced a breakdown voltage and increased a discharge current about 20%. Also the transported plasma excited the sputtered particles effectively. The additional excitation of the sputtered particles increased Mg deposition rate from 70 nm/min to 130 nm/min and from 32 nm/min to 118 nm/min when a distance between the sputtering target and substrate was 250 mm and 350 mm, respectively. Abroad plasma transport near the magnetron sputtering cathode was important to enhance the deposition rate.
机译:通过高密度等离子体辅助溅射源(HiPASS)研究了高速沉积方法。 HiPASS使用空心阴极放电(HCD)喷枪(最大电流:60 A)作为高密度等离子体源。从HCD枪中提取的高密度等离子体通过磁场传输到磁控溅射区域。在磁控管溅射放电中,传输的等离子体降低了击穿电压,并使放电电流增加了约20%。所传输的等离子体也有效地激发了溅射粒子。当溅射靶与基板之间的距离分别为250 mm和350 mm时,溅射粒子的额外激发将Mg沉积速率从70 nm / min增加到130 nm / min,从32 nm / min增加到118 nm / min。磁控溅射阴极附近的国外等离子体传输对提高沉积速率很重要。

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