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首页> 外文期刊>Russian Microelectronics >Dynamics of the Accumulation of Excess Holes in n-AlGaAs/GaAs Heterostructure Quantum Wells
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Dynamics of the Accumulation of Excess Holes in n-AlGaAs/GaAs Heterostructure Quantum Wells

机译:<强调型=“斜体”中的多余孔累积的动态> N -algaas / Gaas异质结构量子孔

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摘要

Abstract The effect of the excess hole capture efficiency on carrier accumulation with increasing photoexcitation in quantum wells of the n -AlGaAs/GaAs heterostructures is investigated. The oscillatory character of the dependence of the ratio between the intensities of photoluminescence from the quantum well and barrier layers on the well width is demonstrated. The hole capture times in the oscillation maximum and minimum are estimated as 3 and 370 ps. The shift of the energy transition in a resonant well under strong excitation is attributed to the charge buildup effect caused by the difference between the electron and hole capture rates.
机译:摘要研究了多余空穴捕获效率对载体积累的效果,随着N-Na-Gaas异质结构的量子孔中的相比光透析。 证明了来自量子阱和屏障层在井宽上的光致发光的强度与井宽度之间的比率的振荡特征。 振荡中的空穴捕获时间估计为3和370 ps。 在强激励下谐振井中的能量转变的偏移归因于电子和空穴捕获速率之间的差异引起的电荷积累效应。

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