Passivation of Semi-Insulating Polycrystalline CdZnTe Films

摘要

SSurface effects play an important role in the overall performance of X-ray detector. The effects ofpassivation with (NH_4)_2S on semi-insulating polycrystalline CdZnTe thick films were analyzed withX-ray photoelectron spectroscopy (XPS), photoconductive decay (PCD), noise power spectrum andpulse height spectra measurements. Sulfur passivation with (HN_4)_2S effectively removes the Te-oxide layers on the CdZnTe surface, reduces the surface leakage current and gives higher energyresolution by suppressing 1/f noise.