Effect of Ar Pressure on Properties of Polycrystalline CdZnTe Films

摘要

Polycrystalline CdZnTe (CZT) films were grown by close-spaced sublimation method. The CdZnTe films were prepared on fluorine doped tin oxide (FTO) glass substrates at various argon (Ar) pressures from 200 Pa to 700 Pa. A comparative study of the films at different pressures was obtained by X-ray diffraction (XRD), scanning electron microscope (SEM) and Energy dispersive spectrometer (EDS) respectively. The XRD studies revealed that CdZnTe films had a preferential orientation along the (111) phase except the one at 500 pa. EDS analysis indicated that the increasing of Ar pressure decreased Zn content.