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A fully wafer-level packaged RF MEMS switch with low actuation voltage using a piezoelectric actuator

机译:使用压电致动器的低致动电压的完整晶圆级封装RF MEMS开关

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In this paper, a fully wafer-level packaged RF MEMS switch has been demonstrated, which has low operation voltage, using a piezoelectric actuator. The piezoelectric actuator was designed to operate at low actuation voltage for application to advanced mobile handsets. The dc contact type RF switch was packaged using the wafer-level bonding process. The CPW transmission lines and piezoelectric actuators have been fabricated on separate wafers and assembled together by the wafer-level eutectic bonding process. A gold and tin composite was used for eutectic bonding at a low temperature of 300 degrees C. Via holes interconnecting the electrical contact pads through the wafer were filled completely with electroplated copper. The fully wafer-level packaged RF MEMS switch showed an insertion loss of 0.63 dB and an isolation of 26.4 dB at 5 GHz. The actuation voltage of the switch was 5 V. The resonant frequency of the piezoelectric actuator was 38.4 kHz and the spring constant of the actuator was calculated to be 9.6 N m(-1). The size of the packaged SPST (single-pole single-through) switch was 1.2 mm x 1.2 mm including the packaging sealing rim. The effect of the proposed package structure on the RF performance was characterized with a device having CPW through lines and vertical feed lines excluding the RF switches. The measured packaging loss was 0.2 dB and the return loss was 33.6 dB at 5 GHz.
机译:在本文中,已经证明了使用压电致动器的全晶圆级封装RF MEMS开关,具有较低的工作电压。压电执行器设计为在低执行电压下工作,可应用于高级手机。直流接触式RF开关采用晶圆级键合工艺进行封装。 CPW传输线和压电致动器已在单独的晶圆上制造,并通过晶圆级共晶键合工艺组装在一起。金和锡的复合材料用于在300摄氏度的低温下进行共晶粘结。使通过晶片互连电接触垫的通孔完全填充有电镀铜。完全晶圆级封装的RF MEMS开关在5 GHz下的插入损耗为0.63 dB,隔离度为26.4 dB。开关的致动电压为5V。压电致动器的共振频率为38.4 kHz,并且致动器的弹簧常数经计算为9.6 N m(-1)。封装后的SPST(单刀单通)开关的尺寸为1.2 mm x 1.2 mm(包括封装密封边)。所提出的封装结构对RF性能的影响是通过具有CPW的器件来实现的,该器件具有通过RF开关的垂直线和垂直线。在5 GHz下测得的封装损耗为0.2 dB,回波损耗为33.6 dB。

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