Diffracted-beam analyzer with multiple single crystals for high resolution parallel- beam X-ray diffraction

摘要

A new high-performance diffracted-beam analyzer consisting of multiple pieces ofperfect crystals in a form of simple and compact device is proposed. Pieces of crystals are setso as to fit their crystal lattice planes with tangent planes of logarithmic spiral, and crystalsurfaces of the analyzer form a shape of one-dimensional polygon. Each piece of the crystalsworks in the same manner as the single crystal analyzer. A diffracted X-ray beam from aspecimen is successively reflected by the individual crystals of the analyzer, and reflected X-ray beams are detected separately by one-dimensional position sensitive detector. If the ana-lyzer consists of, for example, ten pieces of the crystals, ten diffraction patterns can be ob-tained in a single diffractometer scan. Thus a resultant intensity becomes greater by oneorder of magnitude, whereas the angular resolution is the same as that of the single crystalanalyzer. Instrumental setup and experimental results are described.