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X-ray diffraction quantitative analysis method, X-ray diffraction quantitative analyzer, asbestos X-ray diffraction quantitative analysis method and X-ray diffraction quantitative analyzer asbestos

机译:X射线衍射定量分析方法,X射线衍射定量分析仪,石棉X射线衍射定量分析方法和X射线衍射定量分析仪石棉

摘要

PPROBLEM TO BE SOLVED: To easily perform quantitative analysis in a short time by easily generating an analytical curve in a short time. PSOLUTION: A sample to be tested is scanned and read to determine a diffraction intensity profile, determine an integrated quantity of peak waveforms contained in the profile, and determine a content on the basis of an analytical curve and the integrated quantity in a quantitative analysis method. A standard sample having a known content is measured by the prescribed reading step width (0.02) within a wide scanning range (11.0213.2) to determine diffraction line profiles P1-P5. A measured quantity (I) by the reading step with is stored for every standard sample. On the basis of measurement results of the sample to be tested, a quantitative measurement scanning range is determined. An integrated value within the same range (2) as the quantitative measurement scanning range is determined by computations on intensity data by the step width on the stored standard sample to determine an analytical curve on the basis of the integrated quantity and the known content of the standard sample. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:

要解决的问题:通过在短时间内轻松生成分析曲线,可以在短时间内轻松执行定量分析。

解决方案:扫描并读取待测样品,以确定衍射强度曲线,确定该曲线中包含的峰值波形的积分量,并根据分析曲线和积分值确定含量。定量分析方法。在宽的扫描范围(11.0213.2)内,通过规定的读取步长(0.02),对含量已知的标准样品进行测定,求出衍射线轮廓P1-P5。对于每个标准样品,将存储通过读取步骤获得的测量值(I)。根据待测样品的测量结果,确定定量测量扫描范围。通过对强度数据进行计算,并根据存储的标准样品上的步长,确定与定量测量扫描范围相同的范围(2)内的积分值,并根据积分量和样品的已知含量确定分析曲线。标准样品。

版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP5259199B2

    专利类型

  • 公开/公告日2013-08-07

    原文格式PDF

  • 申请/专利权人 株式会社リガク;

    申请/专利号JP20080006331

  • 发明设计人 井上 修一;

    申请日2008-01-15

  • 分类号G01N23/207;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:42

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