A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION

摘要

A new expression of quantitative phase analysis by standardless X-ray diffraction has beenderived using intensity matrix of vector modulus.The criterion of standardless X-raydiffraction analysis was suggested,so as to separate the diffraction pattern of every phasefrom that of sample.The optimal solution could be obtained by the least squares regression.