首页> 美国卫生研究院文献>Materials >Quantitative Analysis of the Recovery Process in Pure Iron Using X-ray Diffraction Line Profile Analysis
【2h】

Quantitative Analysis of the Recovery Process in Pure Iron Using X-ray Diffraction Line Profile Analysis

机译:使用X射线衍射线谱分析定量分析纯铁中的恢复过程

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

We conducted quantitative analysis of the recovery process during pure iron annealing using the modified Williamson-Hall and Warren-Averbach methods. We prepared four types of specimens with different dislocation substructures. By increasing the annealing temperature, we confirmed a decrease in dislocation density. In particular, screw-dislocation density substantially decreased in the early stage of the recovery process, while edge-dislocation density gradually decreased as annealing temperature increased. Moreover, changes in hardness during the recovery process mainly depended on edge-dislocation density. Increases in annealing temperature weakly affected the dislocation arrangement parameter and crystallite size. Recovery-process modeling demonstrated that the decrease in screw-dislocation density during the recovery process was mainly dominated by glide and/or cross-slip with dislocation core diffusion. In contrast, the decrease in edge-dislocation density during the recovery process was governed by a climbing motion with both dislocation core diffusion and lattice self-diffusion. From the above results, we succeeded in quantitatively distinguishing between edge- and screw-dislocation density during the recovery process, which are difficult to distinguish using transmission electron microscope and electron backscatter diffraction.
机译:使用改良的Williamson-Hall和Warren-Averbach方法,对纯铁退火期间对恢复过程进行了定量分析。我们准备了四种类型的样本,具有不同的位错子结构。通过增加退火温度,我们证实了脱位密度的降低。特别地,在回收过程的早期阶段的螺旋位错密度显着降低,而边缘位错密度随着退火温度的增加而逐渐降低。此外,恢复过程中的硬度变化主要依赖于边缘位错密度。退火温度的增加弱影响位错布置参数和微晶尺寸。恢复过程建模表明,恢复过程中的螺旋脱模密度的降低主要由滑动和/或滑倒具有脱位核心扩散的滑移。相反,恢复过程期间的边缘位错密度的降低由攀爬运动控制,其中位错核心扩散和晶格自扩散。根据上述结果,我们成功地在恢复过程中定量区分边缘和螺旋位错密度,这难以使用透射电子显微镜和电子反向散射衍射来区分。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号