X-ray phase-contrast imaging using Laue-case X-ray diffraction with rotatable analyzer crystals

摘要

The present invention provides an X-ray phase-contrast imaging system and method capable of performing time-resolved observation in a short measurement time at the same density resolution and in the same dynamic range as those for a diffraction enhanced X-ray imaging method, and also capable of observing a sample with high sensitivity even if the intensity of an incident X-ray varies with time. A refraction angle of X-ray beams caused by the sample is detected at a time by X-ray imagers by utilizing Laue-case X-ray diffraction by multiple analyzer crystals.