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Designing a 3-D FPGA: Switch Box Architecture and Thermal Issues

机译:设计3-D FPGA:开关盒架构和散热问题

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Three-dimensional (3-D) integration is an attractive technology to reduce wirelengths in a field-programmable gate array (FPGA). However, it suffers from two problems: one, the inter-layer vias are limited in number, and second, the increased power density leads to high junction temperatures. In this paper, we tackle the first problem by designing switch boxes that maximize the use of the vias. Compared to the previously used subset switch box, our best switch box reduces the number of vias by about 49% and area-delay product by about 9%. For the second problem, we utilize the difference in power densities between CLBs and some of the hard blocks in modern FPGAs to distribute the power more uniformly across the FPGA. The peak temperature in a two-layer FPGA reduces by about 16${circ}$ C after our change.
机译:三维(3-D)集成是一种有吸引力的技术,可以减少现场可编程门阵列(FPGA)中的线长。但是,它存在两个问题:一是层间通孔的数量受到限制;二是功率密度的提高导致结温升高。在本文中,我们通过设计可最大化使用过孔的开关盒来解决第一个问题。与以前使用的子集开关盒相比,我们最好的开关盒可将通孔数量减少约49%,将面积延迟乘积减少约9%。对于第二个问题,我们利用CLB和现代FPGA中某些硬模块之间的功率密度差异来在整个FPGA上更均匀地分配功率。更改后,两层FPGA中的峰值温度降低了约16℃。

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