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A Framework for Correction of Multi-Bit Soft Errors in L2 Caches Based on Redundancy

机译:基于冗余的L2缓存中多位软错误校正框架

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With the continuous decrease in the minimum feature size and increase in the chip density due to technology scaling, on-chip L2 caches are becoming increasingly susceptible to multi-bit soft errors. The increase in multi-bit errors could lead to higher risk of data corruption and potentially result in the crashing of application programs. Traditionally, the L2 caches have been protected from soft errors using techniques such as: 1) error detection/correction codes; 2) physical interleaving of cache bit lines to convert multi-bit errors into single-bit errors; and 3) cache scrubbing. While the first two methods incur large area overheads for multi-bit errors, identifying the time interval for scrubbing could be tricky. In this paper, we investigate in detail the multi-bit soft error rates in large L2 caches and propose a framework of solutions for their correction based on the amount of redundancy present in the memory hierarchy. We investigate several new techniques for reducing multi-bit errors in large L2 caches, in which, the multi-bit errors are detected using simple error detection codes and corrected using the data redundancy in the memory hierarchy. We also propose several techniques to control/mine the redundancy in the memory hierarchy to further improve the reliability of the L2 cache. The proposed techniques were implemented in the Simplescalar framework and validated using the SPEC 2000 integer and floating point benchmarks for L2 cache vulnerability, global cache miss-rate, average cycle count and main memory write back rate, considering the area and power overheads. Experimental results indicate that the vulnerability of L2 caches can be decreased by 40% on the average for integer benchmarks and 32% on the average for floating point benchmarks, with an average multi-bit error coverage of about 96%, with significantly less area and power overheads and with virtually no performance penalty. The proposed techniques are applicable to both single and-n-n multi-core processor-based systems.
机译:随着技术规模的扩大,最小特征尺寸的不断减小和芯片密度的增加,片上L2高速缓存越来越容易受到多位软错误的影响。多位错误的增加可能导致更高的数据损坏风险,并可能导致应用程序崩溃。传统上,使用以下技术来保护L2高速缓存不受软错误的影响:1)错误检测/纠正码; 2)高速缓存位线的物理交织,以将多位错误转换为单位错误;和3)缓存清理。尽管前两种方法会产生多位错误的大面积开销,但确定清理时间间隔可能很棘手。在本文中,我们将详细研究大型L2高速缓存中的多位软错误率,并根据内存层次结构中存在的冗余量提出一种用于校正它们的解决方案框架。我们研究了几种用于减少大型L2高速缓存中多位错误的新技术,其中,使用简单的错误检测代码检测多位错误,并使用内存层次结构中的数据冗余进行纠正。我们还提出了几种技术来控制/消除内存层次结构中的冗余,以进一步提高L2缓存的可靠性。拟议的技术在Simplescalar框架中实现,并使用SPEC 2000整数和浮点基准对L2缓存漏洞,全局缓存未命中率,平均周期数和主内存回写率进行了验证,并考虑了面积和功耗。实验结果表明,对于整数基准而言,L2缓存的漏洞平均可以降低40%,对于浮点基准而言,其平均漏洞可以降低32%,平均多位错误覆盖率约为96%,并且面积和占用空间明显更少。电源开销,几乎没有性能损失。所提出的技术适用于基于单核和n-n多核处理器的系统。

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