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首页> 外文期刊>Journal of Semiconductors >Multi-bit upset aware hybrid error-correction for cache in embedded processors
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Multi-bit upset aware hybrid error-correction for cache in embedded processors

机译:嵌入式处理器中用于缓存的多位不安感知混合错误校正

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摘要

For the processor working in the radiation environment in space, it tends to suffer from the single event effect on circuits and system failures, due to cosmic rays and high energy particle radiation. Therefore, the reliability of the processor has become an increasingly serious issue. The BCH-based error correction code can correct multi-bit errors, but it introduces large latency overhead. This paper proposes a hybrid error correction approach that combines BCH and EDAC to correct both multi-bit and single-bit errors for caches with low cost. The proposed technique can correct up to four-bit error, and correct single-bit error in one cycle. Evaluation results show that, the proposed hybrid error-correction scheme can improve the performance of cache accesses up to 20% compared to the pure BCH scheme.
机译:对于在太空中辐射环境中工作的处理器,由于宇宙射线和高能粒子辐射,它容易受到电路和系统故障的单事件影响。因此,处理器的可靠性已经成为越来越严重的问题。基于BCH的纠错码可以纠正多位错误,但是会带来较大的延迟开销。本文提出了一种混合错误校正方法,该方法结合了BCH和EDAC来为低成本的高速缓存校正多位和单位错误。所提出的技术可以纠正多达四位的错误,并在一个周期内纠正一位的错误。评估结果表明,与纯BCH方案相比,所提出的混合纠错方案可以将缓存访问的性能提高20%。

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