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Latin American Test Symposium

召开年：2019
召开地：Santiago(CL)
出版时间：-

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1.Coarse-Grained TMR Soft-Core Processor Fault Tolerance Methods and State Synchronization for Run-Time Fault Recovery

机译：粗粒度TMR软核处理器的容错方法和运行时故障恢复的状态同步
- 作者：Karel Szurman;Zdenek Kotasek
- 会议名称：《Latin American Test Symposium》 | 2019年
- Synchronization;
- Registers;
- Circuit faults;
- Field programmable gate arrays;
- Single event upsets;
- Central Processing Unit;
- Fault tolerant systems;
2.IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time

机译：具有一个时钟周期转换时间的，基于IJTAG兼容延迟线的电压嵌入式仪器
- 作者：Ghazanfar Ali;Jerrin Pathrose;Hans G. Kerkhoff
- 会议名称：《Latin American Test Symposium》 | 2019年
- Instruments;
- Temperature measurement;
- Voltage measurement;
- Monitoring;
- Temperature sensors;
- Propagation delay;
- Timing;
3.Analyzing graph-based algorithms employed to generate test cases from finite state machines

机译：分析用于从有限状态机生成测试用例的基于图的算法
- 作者：Matheus Monteiro Mariano;Érica F. Souza;André T. Endo;Nandamudi L. Vijaykumar
- 会议名称：《Latin American Test Symposium》 | 2019年
- Software algorithms;
- Systematics;
- Test pattern generators;
- Embedded software;
- Computational modeling;
4.MiFIT: A Fault Injection Tool to Validate the Reliability of Microprocessors

机译：MiFIT：故障注入工具，用于验证微处理器的可靠性
- 作者：Alexander Aponte-Moreno;Felipe Restrepo-Calle;Cesar Pedraza
- 会议名称：《Latin American Test Symposium》 | 2019年
- Tools;
- Registers;
- Microcontrollers;
- Hardware;
- Debugging;
- Reliability;
5.OBT applied to a 2nd order continuous time Feedforward Sigma Delta modulator

机译：OBT应用于二阶连续时间前馈Sigma Delta调制器
- 作者：Walter Lancioni;Pablo Petrashin;Luis Toledo;Carlos Vazquez;Juan Castagnola;Fortunato Carlos Dualibe
- 会议名称：《Latin American Test Symposium》 | 2019年
- Modulation;
- Oscillators;
- Circuit faults;
- Testing;
- Sigma-delta modulation;
- Multi-stage noise shaping;
- Computer architecture;
6.Software-Based Mitigation for Memory Address Decoder Aging

机译：基于软件的内存地址解码器老化缓解措施
- 作者：D.H.P. Kraak;C.C. Gürsoy;I.O. Agbo;M. Taouil;M. Jenihhin;J. Raik;S. Hamdioui
- 会议名称：《Latin American Test Symposium》 | 2019年
- Decoding;
- Logic gates;
- Aging;
- Delays;
- Negative bias temperature instability;
- Thermal variables control;
- Degradation;
7.Mixed-level identification of fault redundancy in microprocessors

机译：微处理器中故障冗余的混合级别识别
- 作者：Adeboye Stephen Oyeniran;Raimund Ubar;Maksim Jenihhin;Cemil Cem Gürsoy;Jaan Raik
- 会议名称：《Latin American Test Symposium》 | 2019年
- Circuit faults;
- Integrated circuit modeling;
- Logic gates;
- Test pattern generators;
- Data models;
- Fault diagnosis;
- Redundancy;
8.Defect-Location Identification for Cell-Aware Test

机译：细胞识别测试的缺陷位置识别
- 作者：Zhan Gao;Santosh Malagi;Erik Jan Marinissen;Joe Swenton;Jos Huisken;Kees Goossens
- 会议名称：《Latin American Test Symposium》 | 2019年
- Libraries;
- Cats;
- Tools;
- Layout;
- Transistors;
- Integrated circuits;
- Resistors;
9.A Reliability Analysis of a Deep Neural Network

机译：深度神经网络的可靠性分析
- 作者：Alberto Bosio;Paolo Bernardi;Annachiara Ruospo;Ernesto Sanchez
- 会议名称：《Latin American Test Symposium》 | 2019年
- Software;
- Hardware;
- Topology;
- Safety;
- Built-in self-test;
- Fault diagnosis;
10.A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects

机译：FinFET与基于CMOS的SRAM在电阻缺陷下的比较研究
- 作者：T. S. Copetti;T. R. Balen;E. Brum;C. Aquistapace;L. Bolzani Poehls
- 会议名称：《Latin American Test Symposium》 | 2019年
- FinFETs;
- CMOS technology;
- Circuit faults;
- SRAM cells;
- Semiconductor device modeling;
11.Detecting hard synapses faults in artificial neural networks

机译：在人工神经网络中检测硬突触故障
- 作者：Martin Krcma;Zdenek Kotasek;Jakub Lojda
- 会议名称：《Latin American Test Symposium》 | 2019年
- Neurons;
- Synapses;
- Biological neural networks;
- Task analysis;
- Hardware;
- Redundancy;
12.A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites

机译：卫星通信模块的容错可重构平台
- 作者：Cezar A. Rigo;Lucas M. Luza;Elder D. Tramontin;Victor Martins;Sara Vega Martinez;Leonardo K. Slongo;Laio O. Seman;Luigi Dilillo;Fabian L. Vargas;Eduardo A. Bezerra
- 会议名称：《Latin American Test Symposium》 | 2019年
- Field programmable gate arrays;
- Random access memory;
- Telemetry;
- Hardware;
- Nonvolatile memory;
- Protocols;
- Ionizing radiation;
13.Comparing Exhaustive and Random Fault Injection Methods for Configuration Memory on SRAM-based FPGAs

机译：比较基于SRAM的FPGA上配置存储器的穷举和随机故障注入方法
- 作者：Fabio Benevenuti;Fernanda Lima Kastensmidt
- 会议名称：《Latin American Test Symposium》 | 2019年
- Circuit faults;
- Field programmable gate arrays;
- Random access memory;
- Reliability engineering;
- Hardware;
- Routing;
14.Analyzing the Error Propagation in a Parameterizable Network-on-Chip Router

机译：分析可参数化片上网络路由器中的错误传播
- 作者：Douglas Rossi de Melo;Cesar Albenes Zeferino;Luigi Dilillo;Eduardo Augusto Bezerra
- 会议名称：《Latin American Test Symposium》 | 2019年
- Circuit faults;
- Routing;
- Fault tolerance;
- Fault tolerant systems;
- Integrated circuit interconnections;
- Transient analysis;
- Computer architecture;
15.Probabilistic High-Level Estimation of Vulnerability and Fault Mitigation of Critical Systems Using Fault-Mitigation Trees (FMTs)

机译：使用故障缓解树（FMT）的关键系统的漏洞和故障缓解的概率高级估计
- 作者：Marwan Ammar;Ghaith Bany Hamad;Otmane Ait Mohamed
- 会议名称：《Latin American Test Symposium》 | 2019年
- Analytical models;
- Probabilistic logic;
- Logic gates;
- Automata;
- Fault trees;
- Redundancy;
- Field programmable gate arrays;
16.A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells

机译：FinFET逻辑单元中互连开放缺陷的半分析模型
- 作者：Freddy Forero;Jean-Marc Galliere;Michel Renovell;Victor Champac
- 会议名称：《Latin American Test Symposium》 | 2019年
- Logic gates;
- FinFETs;
- Inverters;
- Semiconductor device modeling;
- Topology;
- Circuit faults;
17.Reliability Analysis of TSN Networks Under SEU Induced Soft Error Using Model Checking

机译：基于SEU的软错下TSN网络的可靠性分析。
- 作者：Ayman A. Atallah;Ghaith Bany Hamad;Otmane Ait Mohamed
- 会议名称：《Latin American Test Symposium》 | 2019年
- Reliability;
- Logic gates;
- Servers;
- Automata;
- Switches;
- Schedules;
- Single event upsets;
18.Analog/Mixed Signal IP DFx from a Foundry perspective

机译：从代工角度看模拟/混合信号IP DFx
- 作者：Salem Abdennadher;Arani Sinha;Yonghyun Kim
- 会议名称：《Latin American Test Symposium》 | 2019年
- IP networks;
- Foundries;
- Hip;
- Tools;
- Discrete Fourier transforms;
- Built-in self-test;
19.SoC Memory Test Optimization using NXP MTR Solutions

机译：使用恩智浦MTR解决方案进行SoC存储器测试优化
- 作者：Rodrigo Zeli;Reinaldo Silveira;Qadeer Qureshi
- 会议名称：《Latin American Test Symposium》 | 2019年
- Optimization;
- Memory management;
- Maintenance engineering;
- Built-in self-test;
- IP networks;
20.Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

机译：使用集成方法间接测试RF电路：它能带来好处吗？
- 作者：H. El Badawi;F. Azais;S. Bernard;M. Comte;V. Kerzérho;F. Lefevre
- 会议名称：《Latin American Test Symposium》 | 2019年
- Predictive models;
- Training;
- Boosting;
- Performance evaluation;
- Radio frequency;
- Bagging;
- Prediction algorithms;
21.LATS 2019 Welcome Message

机译：LATS 2019欢迎辞
- 会议名称：《Latin American Test Symposium》 | 2019年
22.NoCFI: A Hybrid Fault Injection Method for Networks-On-Chip

机译：NoCFI：片上网络的混合故障注入方法
- 作者：Alexandre Coelho;Nacer-Eddine Zergainoh;Raoul Velazco
- 会议名称：《Latin American Test Symposium》 | 2019年
- Circuit faults;
- Computer architecture;
- Microprocessors;
- Transient analysis;
- Field programmable gate arrays;
- Logic gates;
- Layout;
23.A Flexible UVM-Based Verification Framework Reusable with Avalon, AHB, AXI and Wishbone Bus Interfaces for an AES Encryption Module

机译：灵活的基于UVM的验证框架，可与Avalon，AHB，AXI和Wishbone总线接口复用，用于AES加密模块
- 作者：Frank Plasencia-Balabarca;Edward Mitacc-Meza;Mario Raffo-Jara;Carlos Silva-Cárdenas
- 会议名称：《Latin American Test Symposium》 | 2019年
- Measurement;
- Protocols;
- Encryption;
- Bandwidth;
- Data models;
- IP networks;
- Standards;
24.Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model

机译：停留故障模型下开关格的故障缓解
- 作者：Lorena Anghel;Anna Bernasconi;Valentina Ciriani;Luca Frontini;Gabriella Trucco;Ioana Vatajelu
- 会议名称：《Latin American Test Symposium》 | 2019年
- Lattices;
- Circuit faults;
- Switches;
- Fabrication;
- Sensitivity analysis;
- Semiconductor device modeling;
25.Softerror mitigation for multi-core processors based on thread replication

机译：基于线程复制的多核处理器软错误缓解
- 作者：Alejandro Serrano-Cases;Felipe Restrepo-Calle;Sergio Cuenca-Asensi;Antonio Martínez-Álvarez
- 会议名称：《Latin American Test Symposium》 | 2019年
- Instruction sets;
- Synchronization;
- Multicore processing;
- Redundancy;
- Operating systems;
- Hardware;
26.Qubit-driven Fault Simulation

机译：量子位驱动的故障仿真
- 作者：Vladimir Hahanov;Wajeb Gharibi;Eugenia Litvinova;Svetlana Chumachenko
- 会议名称：《Latin American Test Symposium》 | 2019年
- Qubit;
- Circuit faults;
- Mathematical model;
- Computational modeling;
- Data structures;
- Data models;
27.Delay-Tolerant Wireless Networks on Chip: Preliminary Analysis and Results

机译：片上延迟容忍无线网络：初步分析和结果
- 作者：Pablo Ferreyra;Juan A. Fraire;Fabián Gomez;Raoul Velazco;Daniel Sánchez;Dardo Viñas Viscardi
- 会议名称：《Latin American Test Symposium》 | 2019年
- Wireless communication;
- Delays;
- Robustness;
- Protocols;
- Research and development;
- Maintenance engineering;
28.A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture

机译：一种在基于TDMA的多核总线访问中保证关键任务可调度性的新方法
- 作者：Estevan Lara;Guilherme Debon;Roger Goerl;Paulo Villa;Dorian Schramm;Letícia B. Poehls;Fabian Vargas
- 会议名称：《Latin American Test Symposium》 | 2019年
- Task analysis;
- Multicore processing;
- Program processors;
- Timing;
- Real-time systems;
- Pipelines;
- Embedded systems;
29.Identification of Logic Paths Influenced by Severe Coupling Capacitances

机译：识别受严重耦合电容影响的逻辑路径
- 作者：I. D. Meza-Ibarra;V. Champac;R. Gomez-Fuentes;J. R. Noriega;A. Vera-Marquina
- 会议名称：《Latin American Test Symposium》 | 2019年
- Couplings;
- Integrated circuit interconnections;
- Capacitance;
- Integrated circuit modeling;
- Delays;
- Crosstalk;
- Complexity theory;
30.Microservices-based architecture for fault diagnosis in tele-rehabilitation equipment operated via Internet

机译：基于微服务的体系结构，用于通过Internet操作的远程康复设备的故障诊断
- 作者：Juan M. Alvarez Q.;John A. Sanabria O.;Jose I Garcia M.
- 会议名称：《Latin American Test Symposium》 | 2019年
- Computer architecture;
- Fault detection;
- Telemedicine;
- Medical treatment;
- Reliability;
- Protocols;
31.Low latency reconfiguration mechanism for fine-grained processor internal functional units

机译：低延迟重新配置机制，用于细粒度的处理器内部功能单元
- 作者：Raphael Segabinazzi Ferreira;Jörg Nolte
- 会议名称：《Latin American Test Symposium》 | 2019年
- Registers;
- Operating systems;
- Computer architecture;
- Pipelines;
- Redundancy;
32.Reliability Indicators for Automatic Design and Analysis of Fault-Tolerant FPGA Systems

机译：自动设计和分析容错FPGA系统的可靠性指标
- 作者：Jakub Lojda;Jakub Podivinsky;Zdenek Kotasek
- 会议名称：《Latin American Test Symposium》 | 2019年
33.Extended Reliability Analysis of Fault-Tolerant FPGA-based Robot Controller

机译：基于容错FPGA的机器人控制器的扩展可靠性分析
- 作者：Jakub Podivinsky;Jakub Lojda;Zdenek Kotasek
- 会议名称：《Latin American Test Symposium》 | 2019年
- Robots;
- Fault tolerant systems;
- Field programmable gate arrays;
- Monitoring;
- Redundancy;
34.Online Correction of Hard Errors and Soft Errors via One-Step Decodable OLS Codes for Emerging Last Level Caches

机译：通过一步可解码OLS代码在线纠正硬错误和软错误，以生成最新的末级高速缓存
- 作者：Abhishek Das;Nur A. Touba
- 会议名称：《Latin American Test Symposium》 | 2019年
- Decoding;
- Parity check codes;
- Magnetic tunneling;
- Random access memory;
- Memory management;
- Encoding;
- Error correction codes;
35.Reducing Overheads in Software-based Fault Tolerant Systems using Approximate Computing

机译：使用近似计算减少基于软件的容错系统中的开销
- 作者：Alexander Aponte-Moreno;Cesar Pedraza;Felipe Restrepo-Calle
- 会议名称：《Latin American Test Symposium》 | 2019年
- Software;
- Fault tolerant systems;
- Registers;
- Fault tolerance;
- Hardware;
- Approximate computing;
- Circuit faults;
36.Electromagnetic Immunity Test of Analog-to-Digital Interfaces of a Mixed-Signal Programmable SoC

机译：混合信号可编程SoC的模数接口的电磁抗扰性测试
- 作者：Luiz G. S. Dias;Carlos J. Gonzalez;Fernando J. Boeira;Tiago R. Balen
- 会议名称：《Latin American Test Symposium》 | 2019年
- Electromagnetic interference;
- Performance evaluation;
- System-on-chip;
- Data acquisition;
- Electromagnetics;
- Computer architecture;
- Registers;
37.On the evaluation of SEU effects in GPGPUs

机译：关于GPGPU中SEU效果的评估
- 作者：B. Du;Josie E. Rodriguez Condia;M. Sonza Reorda;L. Sterpone
- 会议名称：《Latin American Test Symposium》 | 2019年
- graphics processing units;
- parallel architectures;
- radiation effects;
- radiation hardening (electronics);
38.A Wireless Embedded System for Measuring the Effects of Ionizing Radiations

机译：用于测量电离辐射影响的无线嵌入式系统
- 作者：Daniel Sánchez;Pablo Ferreyra;Juan A. Fraire;Fabián Gomez;Raoul Velazco;Dardo Viñas Viscardi
- 会议名称：《Latin American Test Symposium》 | 2019年
- Wireless communication;
- Field programmable gate arrays;
- Current measurement;
- Monitoring;
- Mobile handsets;
- Tools;
- Performance evaluation;
39.A Non-Linearity Compensation Technique for Charge-Redistribution SAR ADCs

机译：电荷分配SAR ADC的非线性补偿技术
- 作者：Enrique Alvarez-Fontecilla;Angel Abusleme
- 会议名称：《Latin American Test Symposium》 | 2019年
- Capacitors;
- Linearity;
- Capacitance;
- Method of moments;
- Metals;
- Layout;
- Fabrication;
40.Cluster-based Localization of IR-drop in Test Application considering Parasitic Elements

机译：考虑寄生因素的测试应用中基于IR-drop的群集定位
- 作者：Harshad Dhotre;Stephan Eggersglüß;Rolf Drechsler
- 会议名称：《Latin American Test Symposium》 | 2019年
- Switches;
- Feature extraction;
- Layout;
- Capacitance;
- Testing;
- Pins;
- Tools;