首页> 外文OA文献 >An Error Correction Scheme through Time Redundancy for Enhancing Persistent Soft-Error Tolerance of CGRAs
【2h】

An Error Correction Scheme through Time Redundancy for Enhancing Persistent Soft-Error Tolerance of CGRAs

机译:一种通过时间冗余的纠错方案,用于增强CGRas的持久软错误容差

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Time redundancy is sometimes an only option for enhancing circuit reliability when the circuit area is severely restricted. In this paper, a time-redundant error-correction scheme, which is particularly suitable for coarse-grained reconfigurable arrays (CGRAs), is proposed. It judges the correctness of the executions by comparing the results of two identical runs. Once a mismatch is found, the second run is terminated immediately to start the third run, under the assumption that the errors tend to persist in many applications, for selecting the correct result in the three runs. The circuit area and reliability of the proposed method is compared with a straightforward implementation of time-redundancy and a selective triple modular redundancy (TMR). A case study on a CGRA revealed that the area of the proposed method is 1% larger than that of the implementation for the selective TMR. The study also shows the proposed scheme is up to 2.6x more reliable than the full-TMR when the persistent error is predominant.
机译:时间冗余有时是仅在电路区域严格限制时提高电路可靠性的唯一选项。在本文中,提出了一种冗余的误差校正方案,特别适用于粗粒粒度可重新配置阵列(CGRA)。它通过比较两个相同的运行的结果来判断执行的正确性。一旦发现不匹配,第二次运行立即终止以启动第三个运行,假设错误倾向于在许多应用程序中持续存在,用于选择三个运行中的正确结果。将所提出的方法的电路区域和可靠性与时间冗余的直接实现和选择性三重模块化冗余(TMR)进行比较。对CGRA的案例研究显示,所提出的方法的面积比选择性TMR的实施大于1%。该研究还显示了所提出的方案高达2.6倍比全TMR更可靠,当持续错误是主要的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号