Actively Alleviate Power Gating-Induced Power/Ground Noise Using Parasitic Capacitance of On-Chip Memories in MPSoC

摘要

By integrating multiple processing units (PUs) and memories on a single chip, multiprocessor system-on-chip (MPSoC) can provide higher performance per energy and lower cost per function to applications with growing complexity. On the other hand, shrinking feature sizes and reducing power supply voltages also make MPSoCs more susceptible to various reliability threats, such as power/ground (P/G) noises. Power gating is an effective technique to minimize leakage power. However, it also introduces significant P/G noises in MPSoCs. With significant area, power and performance overheads, traditional methods rely on reinforced circuits or fixed protection strategies to reduce P/G noises caused by power gating. In this paper, we propose a systematic approach to actively alleviating P/G noises using the parasitic capacitance of on-chip memories through sensor network on-chip (SENoC). We use the parasitic capacitance of on-chip memories as dynamic decoupling capacitance to suppress P/G noises and develop a detailed HSPICE model for related study. SENoC is developed to not only monitor and report P/G noises, but also coordinate PUs and memories to alleviate such transient threats at run time. Extensive evaluations show that compared with traditional method, our approach saves 12.6%–62.8% energy consumption and achieves 14.3%–69.8% performance improvement for different applications and MPSoCs with different scales. We implement the circuit details of our approach and show its low area and energy consumption overheads.