An Adaptive Process-Variation-Aware Technique for Power-Gating-Induced Power/Ground Noise Mitigation in MPSoC

摘要

Power gating (PG) is one of the most effective techniques to reduce the leakage power in multiprocessor system-on-chips (MPSoCs). However, the power-mode transition during the PG period of an individual processing unit (PU) will introduce serious power/ground (P/G) noise to the neighboring PUs. As technology scales, the P/G noise problem becomes a severe reliability threat to MPSoCs. At the same time, the increasing manufacturing process variations (PVs) also bring uncertainties to the P/G noise problem and make it difficult to predict and mitigate. To tackle this problem, in this paper, we analyze the PG-induced P/G noise in the presence of PVs and propose a hardware–software collaborated runtime technique to adaptively protect PUs from P/G noise. Sensor network-on-chip is used to gather noise information and coordinate different system components. An online PV-aware algorithm is developed to effectively decide the noise impact range and arrange protections for affected PUs based on the collected noise information. We evaluate the proposed technique through cycle-level Monte Carlo simulations of NoC-based MPSoCs in different scales. The experimental results on various realistic applications show that our technique could achieve comparable reliability to the most reliable static technique while improve on average 3.78%–29.5% the system energy efficiency and reduce 15.7%–70.4% the performance penalty on different MPSoC scales.