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首页> 外文期刊>Very Large Scale Integration (VLSI) Systems, IEEE Transactions on >PROCEED: A Pareto Optimization-Based Circuit-Level Evaluator for Emerging Devices
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PROCEED: A Pareto Optimization-Based Circuit-Level Evaluator for Emerging Devices

机译:继续:用于新兴设备的基于Pareto优化的电路级评估器

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摘要

Evaluation of novel devices in the context of circuits is crucial to identifying and maximizing their value. We propose a new framework, Pareto optimization-based circuit-level evaluator for emerging device (PROCEED), that uses comprehensive performance, power, and area metrics for accurate device-circuit coevaluation through optimization of digital circuit benchmarks. The PROCEED assesses technology suitability over a wide operating region (megahertz to gigahertz) by leveraging available circuit knobs (threshold voltage assignment, power management, sizing, and so on). It improves the benchmark accuracy by to compared with the existing methods while offering orders of magnitude improvements in runtime over full physical design implementation flows. To illustrate the PROCEED's capabilities, we deploy it to assess emerging technologies, including novel tunneling field-effect transistors, compared with conventional silicon CMOS. As a further illustration, we extend PROCEED to evaluate future heterogeneous integration of varied devices onto the same silicon substrate.
机译:在电路中评估新型器件对于识别和最大化其价值至关重要。我们提出了一个新框架,即针对新兴设备的基于Pareto优化的电路级评估器(PROCEED),该框架使用全面的性能,功率和面积指标,通过优化数字电路基准来进行准确的设备-电路协评估。 PROCEED通过利用可用的电路旋钮(阈值电压分配,电源管理,选型等)来评估技术在整个工作区域(兆赫兹至千兆赫兹)中的适用性。与现有方法相比,它提高了基准精度,同时在整个物理设计实现流程上,在运行时方面提供了数量级的改进。为了说明PROCEED的功能,我们将其部署以评估新兴技术,包括与传统的硅CMOS相比的新型隧道效应晶体管。作为进一步的说明,我们将PROCEED扩展为评估将来将各种器件异种集成到同一硅基板上的方法。

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