首页> 外文会议> >PROCEED: A pareto optimization-based circuit-level evaluator for emerging devices
【24h】

PROCEED: A pareto optimization-based circuit-level evaluator for emerging devices

机译:继续:针对新兴设备的基于pareto优化的电路级评估器

获取原文

摘要

Evaluation of novel devices in a circuit context is crucial to identifying and maximizing their value. We propose a new framework, PROCEED, and metrics for accurate device-circuit co-evaluation through proper optimization of digital circuit benchmarks. PROCEED assesses technology suitability over a wide operating region (MHz to GHz) by leveraging available circuit knobs (Vt assignment, power management, sizing, etc.) and improves accuracy by 3X to 115X compared to existing methods while offering orders of magnitude improvements in runtime over full physical design implementation flows. To illustrate PROCEED's capabilities, we deploy it to assess novel tunneling transistors (TFETs) compared to conventional CMOS.
机译:在电路环境中评估新型器件对于识别和最大化其价值至关重要。我们提出了一个新的框架,PROCEED和度量标准,可以通过适当优化数字电路基准来进行准确的器件-电路协同评估。 PROCEED通过利用可用的电路旋钮(Vt分配,电源管理,尺寸调整等),评估了在宽工作区域(MHz至GHz)上的技术适用性,与现有方法相比,其精度提高了3倍至115倍,同时在运行时间方面提供了数量级的改进完整的物理设计实施流程。为了说明PROCEED的功能,我们将其部署为评估与传统CMOS相比的新型隧穿晶体管(TFET)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号