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500-Mb/s nonprecharged data bus for high-speed DRAM's

机译:500-Mb / s非预充电数据总线,用于高速DRAM

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A nonprecharged data-bus scheme to enhance the intrinsic read data rate of DRAM cores is proposed. Eliminating the precharge cycle of the DRAM data bus can reduce the unit bit time. A differential partial response detection data-bus amplifier is also employed to detect signals on the nonprecharged data bus that are degraded by large intersymbol interference. To enhance the read operation further, column selections are overlapped by interleaved column decoders. To increase the operating margin of the nonprecharged data-bus read, a skew-controlled column-selection pulse generator was developed. An isolated sense-amplifier scheme increases the write data rate of the DRAM core. To verify these schemes, a 4-Mb DRAM was fabricated via 0.24-/spl mu/m DRAM technology. These schemes realized a 500-Mb/s per data-bus read operation and a 100-Mb/s per data-bus write operation without an area penalty.
机译:提出了一种非预充电数据总线方案,以提高DRAM内核的固有读取数据速率。消除DRAM数据总线的预充电周期可以减少单位位时间。差分部分响应检测数据总线放大器也用于检测未预充电的数据总线上的信号,这些信号由于较大的符号间干扰而劣化。为了进一步增强读取操作,列选择被交错的列解码器重叠。为了增加非预充电数据总线读取的操作余量,开发了一种偏斜控制的列选择脉冲发生器。隔离式感测放大器方案可提高DRAM内核的写入数据速率。为了验证这些方案,通过0.24- / spl mu / m DRAM技术制造了4-Mb DRAM。这些方案实现了每个数据总线读取操作500-Mb / s和每个数据总线写入操作100-Mb / s,而没有面积损失。

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