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Fabrication of amorphous InGaZnO thin-film transistor-driven flexible thermal and pressure sensors

机译:非晶InGaZnO薄膜晶体管驱动的柔性热压传感器的制造

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摘要

In this work, we present the results concerning the use of amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistor (TFT) as a driving transistor of the flexible thermal and pressure sensors which are applicable to artificial skin systems. Although the a-IGZO TFT has been attracting much attention as a driving transistor of the next-generation flat panel displays, no study has been performed about the application of this new device to the driving transistor of the flexible sensors yet. The proposed thermal sensor pixel is composed of the series-connected a-IGZO TFT and ZnO-based thermistor fabricated on a polished metal foil, and the ZnO-based thermistor is replaced by the pressure sensitive rubber in the pressure sensor pixel. In both sensor pixels, the a-IGZO TFT acts as the driving transistor and the temperature/pressure-dependent resistance of the ZnO-based thermistor/pressure-sensitive rubber mainly determines the magnitude of the output currents. The fabricated a-IGZO TFT-driven flexible thermal sensor shows around a seven times increase in the output current as the temperature increases from 20 ℃ to 100 ℃, and the a-IGZO TFT-driven flexible pressure sensors also exhibit high sensitivity under various pressure environments.
机译:在这项工作中,我们介绍了有关使用非晶铟镓锌氧化物(a-IGZO)薄膜晶体管(TFT)作为适用于人造皮肤系统的柔性热和压力传感器的驱动晶体管的结果。尽管作为下一代平板显示器的驱动晶体管,a-IGZO TFT引起了人们的广泛关注,但尚未进行有关将该新器件应用于柔性传感器的驱动晶体管的研究。提出的热传感器像素由串联的a-IGZO TFT和在抛光金属箔上制造的ZnO基热敏电阻组成,并且ZnO基热敏电阻被压力传感器像素中的压敏橡胶代替。在两个传感器像素中,a-IGZO TFT都用作驱动晶体管,基于ZnO的热敏电阻/压敏橡胶的温度/压力相关电阻主要决定了输出电流的大小。制成的a-IGZO TFT驱动的柔性温度传感器在温度从20℃升高到100℃时显示出约7倍的输出电流增加,并且a-IGZO TFT驱动的柔性压力传感器在各种压力下也具有很高的灵敏度。环境。

著录项

  • 来源
    《Semiconductor science and technology》 |2012年第10期|p.105019.1-105019.6|共6页
  • 作者单位

    School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea;

    School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea;

    School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea;

    School of Electrical Engineering and Computer Science, Seoul National University, Seoul 151-742, Korea;

    Department of Electronic Engineering, Gachon University, Gyeonggi-do 461-701, Korea;

    Department of Electronic Engineering, Gachon University, Gyeonggi-do 461-701, Korea;

    Convergence Components & Materials Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea, Advanced Device Technology, University of Science and Technology, Daejeon 305-333, Korea;

    Convergence Components & Materials Research Laboratory, Electronics and Telecommunications Research Institute, Daejeon 305-700, Korea, Advanced Device Technology, University of Science and Technology, Daejeon 305-333, Korea;

    School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea;

    School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 156-756, Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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