Time-Resolved Spot Size Measurements From Various Radiographic Diodes on the RITS-3 Accelerator

摘要

Sandia National Laboratories is leading an intensive research effort into fielding and diagnosing electron-beam flash radiographic X-ray sources. Several X-ray sources are presently being studied, including the self-magnetic pinched diode, the immersed Bz diode, and the plasma-filled flat cathode (paraxial) diode. These studies are being carried out on RITS-3, an inductive voltage adder accelerator capable of delivering 140 kA at 5 MV with a radiation pulse of 70-ns full width at half maximum. The interactions of the electron beam with plasmas created at the anode and/or cathode, for the self-pinched and Bz diode or in the plasma cell for the paraxial diode, can greatly effect the temporal behavior of the radiation spot size. Measuring the dynamic behavior of the beam size and coupling this with theoretical models of the beam plasma interactions can lead to improvements that can be made in these sources. A time-resolved spot size diagnostic (TRSD) has been developed and fielded on RITS-3. This diagnostic consists of a linear array of scintillating fibers, shadowed by a tungsten rolled edge. The scintillating array is optically coupled to a streak camera, and the output is recorded on a charge-coupled device. This paper presents a description of this second-generation TRSD as well as data on the time history behavior of the spot sizes for these three diodes.