Time Resolved Radiographic Spot Size Measurements of the Self-MAgnetic Pinch Diode using a Multi-Frame Fast Gating ICCD Camera System

摘要

Summary form only given. The nanosecond gating controller (NSGC) camera system has been used to observe the time-resolved radiographic spot behavior of the self-magnetic pinch (SMP) diode, operating on the EROS (AWE Aldermaston) and RITS (Sandia National Laboratories) multi-megavolt flash X-ray generators. Images of scintillations produced by the X-ray spot with 3-5 ns exposure times have been recorded. Details of the development of the diagnostic from a 4- to 9-frame capability, as well as its application to the flash X-ray environment are described. Observations of the SMP diode X-ray spot size and wander as a function of time relative to the observable dose threshold are presented and compared to large scale plasma (LSP) 2D and 3D code predictions. The influence of the experimental results on current understanding of SMP diode operation is discussed, with the role of anode plasmas on the electron beam explored