首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Continuing study on the photoelectron and secondary electron yield of TiN coating and NEG (Ti-Zr-V) coating under intense photon irradiation at the KEKB positron ring
【24h】

Continuing study on the photoelectron and secondary electron yield of TiN coating and NEG (Ti-Zr-V) coating under intense photon irradiation at the KEKB positron ring

机译:KEKB正电子环在强光子辐照下TiN涂层和NEG(Ti-Zr-V)涂层的光电子和二次电子产率的连续研究

获取原文
获取原文并翻译 | 示例

摘要

In order to investigate a way to suppress the electron-cloud instability (ECI), the secondary electron and photoelectron yields (SEY and PEY) of a TiN coating were studied with an intense positron beam at the KEK B-Factory (KEKB), following up our previous study on a NEG (Ti-Zr-V) coating. A TiN-coated chamber was installed at an arc section of the KEKB positron ring, where photons with a line density of 6.5 x 10~(14) photons m~(-1) s~(-1) mA~(-1) were directly irradiated. The number of electrons around the positron bunches was measured by a special electron-current monitor, up to a stored beam current of about 1700 mA (1284 bunches). The electron current of the TiN-coated chamber was clearly smaller than those of the NEG-coated and the non-coated copper chambers by a factor of 2 for all beam currents. Using the previous results of the NEG-coated and the non-coated copper chambers as well as the TiN-coated one here, the maximum SEY (δ_(max)) and the PEY (η_e) of the TiN coating, the NEG coating and the copper were again estimated based on a simulation. The evaluated δ_(max) values for these three surfaces were 0.8-1.0, 0.9-1.1 and 1.1-1.3, and the η_e values were 0.13-0.15, 0.22-0.27 and 0.28-0.31, respectively. It was found that the TiN coating had an SEY (δ_(max)~0.9) as low as the NEG coating (δ_(max)~1.0), but the electron current was clearly smaller than that of the NEG coating, due to its lower photoelectron yield (η_e~0.14). This study again indicated that the suppression of photoelectrons is required to make effective use of a surface with a low SEY, such as a TiN or a NEG coating. As an application of the simulation code, the electron current of a beam duct with an antechamber was calculated for the case of a NEG coating or a TiN coating (δ_(max)= 0.9-1.0). The calculated electron current for a copper duct with an antechamber was about 1/4 of that of a simple circular copper duct (δ_(max) = 1.2 for both cases) at a high current (~ 1700 mA, 1284 bunches), which was in good agreement with the measurement. By combining with a surface with a low SEY (δ_(max) = 1.0-0.9), that is, a TiN coating or a NEG coating, a further reduction of the electron current by a factor of about 2 was obtained.
机译:为了研究抑制电子云不稳定性(ECI)的方法,在KEK B工厂(KEKB)用强正电子束研究了TiN涂层的二次电子和光电子产率(SEY和PEY)。我们之前关于NEG(Ti-Zr-V)涂层的研究。在KEKB正电子环的弧形部分安装了一个涂有TiN的腔室,其中光子的线密度为6.5 x 10〜(14)个光子m〜(-1)s〜(-1)mA〜(-1)被直接照射。正电子束周围的电子数量通过特殊的电子电流监控器测量,直到存储的电子束电流约为1700 mA(1284束)。对于所有束电流,TiN涂层腔室的电子电流明显小于NEG涂层腔室和非涂层铜腔室的电子电流。使用先前的NEG涂层和非涂层铜腔室以及TiN涂层腔室的先前结果,TiN涂层,NEG涂层的最大SEY(δ_(max))和PEY(η_e)最大再次基于模拟对铜进行了估算。这三个表面的δ_(max)评估值为0.8-1.0、0.9-1.1和1.1-1.3,η_e值分别为0.13-0.15、0.22-0.27和0.28-0.31。结果发现,TiN涂层的SEY(δ_(max)〜0.9)低于NEG涂层(δ_(max)〜1.0),但由于其电子电流明显小于NEG涂层,因此电子电流明显小于NEG涂层。较低的光电子产率(η_e〜0.14)。这项研究再次表明,要有效利用具有低SEY的表面(例如TiN或NEG涂层),必须抑制光电子。作为模拟代码的应用,对于NEG涂层或TiN涂层(δ_(max)= 0.9-1.0),计算了带有前室的束导管的电子电流。在高电流(〜1700 mA,1284束)下,计算出具有前室的铜导管的电子电流约为简单圆形铜导管的电子电流的1/4(两种情况下的δ_(max)= 1.2),这是与测量结果非常吻合。通过与低SEY(δ_(max)= 1.0-0.9)的表面(即TiN涂层或NEG涂层)结合,可以将电子电流进一步降低约2倍。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号