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Reliability study of the assembly of a large BGA on a build up board using thermo-mechanical simulations

机译:使用热机械模拟对大型BGA在组装板上进行组装的可靠性研究

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In a full array PBGA (Plastic Ball Grid Array), the location of the most stressed ball is reported to be under the die, at the die's edge or at the package's corner, depending on various parameters such as the substrate thickness, used materials, and so on. Thermo-mechanical simulations of such assemblies can help analysing the impact of these parameters on the global reliability of the assembly. The importance of residual stresses, stored in the assembly during the reflow process, can also be evaluated.
机译:在全阵列PBGA(塑料球栅阵列)中,据报道,受力最大的球位于芯片下方,芯片边缘或封装拐角处,具体取决于各种参数,例如基板厚度,使用的材料,等等。这种组件的热机械模拟可以帮助分析这些参数对组件整体可靠性的影响。还可以评估在回流过程中存储在组件中的残余应力的重要性。

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