机译:4H-SiC衬底中基面位错密度对体二极管正向电压退化的影响
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan,Fuji Electric Co., Ltd. 1 Fuji-cho, Hino-city, Tokyo 191-8502, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan;
Rigaku Corporation, 3-9-12 Matsubara-cho, Akishima-shi, Tokyo 196-8666, Japan;
Rigaku Corporation, 3-9-12 Matsubara-cho, Akishima-shi, Tokyo 196-8666, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology (AIST), 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan;
SiC; Basal plane dislocation; body-diode; X-ray topography; stacking faults; C-face;
机译:抑制4H-SiC PiN二极管由于衬底基面位错引起的正向偏置退化的数值研究
机译:基面位错结构对4H-SiC p-i-n二极管正向电流退化中单个肖克利型堆叠故障扩展的影响
机译:传播和转换后的基础平面位错引起的正向电压降级的比较评估
机译:基面错位导致4H-SiC高压器件中多数载流子导电和阻挡能力的下降
机译:用于稳定双极二极管的4H-碳化硅的低基面位错密度外延层的生长。
机译:4H-SiC 100 mm PVT生长过程中基面位错密度和热机械应力分析
机译:基底平面位错密度和热机械应力在100 mm PVT生长期间的4H-SIC期间