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DESIGN OF MODIFIED FOUR-PHASE CMOS CHARGE PUMPS FOR LOW-VOLTAGE FLASH MEMORIES

机译:低压闪存存储器的改进型四相CMOS电荷泵设计

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A new four-phase clock scheme for the four-phase charge pumping circuits using standard 0.5 μm CMOS technology at low supply voltages to generate high boosted voltages is proposed. Boosted clocks without high drivability are applied on the capacitors coupled to the gates of the main charge transfer transistors to compensate body effects. Thus, the high-voltage clock generation circuit can be easily achieved for clock frequency of 10 MHz. Due to the nearly ideal pumping gain per stage, the design methodology to optimize power efficiency is also presented. With the new clock scheme, it can efficiently pump to 9 V at supply voltage of 1 V using 10 stages by simulations, while pump to 4.7 V at supply voltage of 1.5 V using four stages by measurements.
机译:提出了一种新的用于四相电荷泵浦电路的四相时钟方案,该方案使用标准的0.5μmCMOS技术在低电源电压下产生高升压电压。没有高可驱动性的升压时钟被施加到与主电荷转移晶体管的栅极耦合的电容器上,以补偿体效应。因此,对于10MHz的时钟频率,可以容易地实现高压时钟生成电路。由于每级的近乎理想的泵浦增益,还介绍了优化功率效率的设计方法。利用新的时钟方案,它可以通过10个阶段通过仿真有效地以1 V的电源电压将其泵浦至9 V,而通过四个阶段通过测量可以以1.5 V的电源电压将其泵浦至4.7V。

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