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Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes

机译：考虑低压CmOs工艺中栅氧化层可靠性的电荷泵电路设计

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Ming-dou Ker; Senior Member; Shih-lun Chen; Student Member; Chia-shen Tsai;
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年度 2006
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1. Design of Charge Pump Circuit With Consideration of Gate-Oxide Reliability in Low-Voltage CMOS Processes [J] . Ming-Dou Ker, Shih-Lun Chen, Chia-Shen Tsai IEEE Journal of Solid-State Circuits . 2006,第5期

机译：低压CMOS工艺中考虑栅氧化物可靠性的电荷泵电路设计
2. Ultra-High-Voltage Charge Pump Circuit in Low-Voltage Bulk CMOS Processes With Polysilicon Diodes [J] . Ming-Dou Ker, Shih-Lun Chen IEEE transactions on circuits and systems. II, Express briefs . 2007,第1期

机译：具有多晶硅二极管的低压大容量CMOS工艺中的超高压电荷泵电路
3. Ultra-High-Voltage Charge Pump Circuit in Low-Voltage Bulk CMOS Processes With Polysilicon Diodes [J] . Ker M.-D., Chen S.-L. IEEE Transactions on Circuits and Systems. II, Analog and Digital Signal Processing . 2007,第2期

机译：具有多晶硅二极管的低压大容量CMOS工艺中的超高压电荷泵电路
4. A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide Reliability in Low-Voltage CMOS Processes [C] . Tzu-Ming Wang, Wan-Yi Shen, Ming-Dou Ker IEEE International Conference on Electronics, Circuits and Systems . 2007

机译：用于低压CMOS工艺的电荷泵电路的新架构，不受氧化栅极可靠性
5. Integrated circuit design considerations for spacecraft VLSI implemented in standard CMOS processes. [D] . Martin, Mark Noel. 2000

机译：在标准CMOS工艺中实现的航天器VLSI的集成电路设计注意事项。
6. Fabrication of Ultra-Thin Printed Organic TFT CMOS Logic Circuits Optimized for Low-Voltage Wearable Sensor Applications [O] . Yasunori Takeda, Kazuma Hayasaka, Rei Shiwaku, -1

机译：为低压可穿戴传感器应用而优化的超薄印刷有机TFT CMOS逻辑电路的制造
7. A new charge pump circuit dealing with gate-oxide reliability issue in low-voltage processes [O] . Ming-dou Ker, Shih-lun Chen, Chia-sheng Tsai 2015

机译：一种新的电荷泵电路，用于处理低压过程中的栅极氧化物可靠性问题

Design of charge pump circuit with consideration of gate-oxide reliability in low-voltage CMOS processes

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