首页> 外文期刊>International journal of modeling, simulation and scientific computing >Experimental and finite element analysis on determining the fatigue life of pb-free solder joint (Sn-0.5Cu-3Bi-1Ag) used in electronic packages under harmonic loads
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Experimental and finite element analysis on determining the fatigue life of pb-free solder joint (Sn-0.5Cu-3Bi-1Ag) used in electronic packages under harmonic loads

机译:在谐波载荷下,在电子封装下使用电子封装的无铅焊点(SN-0.5Cu-3Bi-1Ag)疲劳寿命的实验和有限元分析

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Electronic packages that are used these days are exposed to different types of vibration loadings in their usage environment. This vibration exposure can be categorized as harmonic and random vibrations. When reliability assessment of modern electronic systems is considered, vibration loading has an important role to play. One of the biggest challenges facing today is the accurate and rapid assessment of fatigue life under the vibration loading. Conventional solder joints were made of lead-tin alloy. According to many environment legislations and rules, lead is prohibited as an ingredient in the solder alloy. The reason for the prohibition of the usage of the lead is that it poisons the environment. In this study, Sn-0.5Cu-3Bi-lAg is used as the lead-free solder alloy. Fatigue life prediction of electronic package containing SAC405 is conducted with the aid of vibration testing and Finite element analysis under harmonic vibration loading. A specially designed Plastic Ball Grid Array Package (PBGA) component is mounted on Printed Circuit Board (PCB). It is taken as a test vehicle for the vibration test. The test vehicle is excited by a sinusoidal vibration. The frequency of this excitation equals the fundamental frequency of the test vehicle and it is continued till the component fails. Since the solder balls are very small for direct measurement, Finite Element analysis (FEA) is used for noting down the stresses. The stress versus failures cycles (S-N) curve is made by relating both the stresses on the solder balls obtained and the number of failure cycles from vibration analysis. The fatigue life of the component can be estimated from the generated S-N curve. It is analyzed that the methodology is effective in predicting the component's life. Hence, the reliability of electronic package can be improved.
机译:这些天使用的电子封装在使用环境中暴露于不同类型的振动装载。这种振动曝光可以分类为谐波和随机振动。当考虑现代电子系统的可靠性评估时,振动载荷具有重要作用。今天面临的最大挑战之一是在振动载荷下对疲劳寿命的准确和快速评估。常规焊点由铅锡合金制成。根据许多环境立法和规则,铅被批准为焊料合金的成分。禁止使用铅的原因是它淘汰环境。在本研究中,Sn-0.5Cu-3Bi-LAG用作无铅焊料合金。借助于振动检测和谐波振动载荷下的振动测试和有限元分析进行了含有SAC405的电子包装的疲劳寿命预测。专门设计的塑料球栅阵列包装(PBGA)组件安装在印刷电路板(PCB)上。它是用于振动测试的测试车辆。测试车辆通过正弦振动激发。这种激励的频率等于测试车辆的基本频率,并且持续到部件发生故障。由于焊球对于直接测量非常小,因此有限元分析(FEA)用于注意到应力。通过将所获得的焊球上的应力与振动分析的故障循环的数量相关联来制造应力与故障循环循环(S-N)曲线。可以从产生的S-N曲线估计部件的疲劳寿命。分析了该方法在预测组件的生命方面是有效的。因此,可以提高电子包装的可靠性。

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