首页> 外文期刊>Integration >Current-flow and current-density-aware multi-objective optimization of analog IC placement
【24h】

Current-flow and current-density-aware multi-objective optimization of analog IC placement

机译:电流和电流密度感知的多目标模拟IC放置优化

获取原文
获取原文并翻译 | 示例

摘要

In this paper, the concept of hierarchical multi-objective optimization is applied to analog integrated circuit placement automation, where current-flow and current-density considerations are taken to improve the reliability and, reduce post-layout routing-induced parasitics of the circuit. The current-flow constraints are satisfied by forcing a monotonic routing directly in an absolute placement representation, while the impact of current-intensive interconnects is mitigated with the electromigration-aware optimization of the optimal wiring topology for all nets of the circuit. The problem's complexity is reduced using the hierarchy in the circuit's partitions, combining, bottom-up, Pareto fronts of placements that explore the tradeoffs between the design objectives. The approach is demonstrated in analog circuit structures for the United Microelectronics Corporation 130 nm design process. Post-layout simulations show the importance of considering both current-flow and current-density considerations for an effective fully-automatic placement. (C) 2016 Elsevier B.V. All rights reserved.
机译:本文将分层多目标优化的概念应用于模拟集成电路布局自动化,其中考虑了电流和电流密度,以提高可靠性并减少布线后布线引起的电路寄生现象。通过直接在绝对布局表示中强制执行单调布线来满足电流约束,同时通过对电路所有网络的最佳布线拓扑进行电迁移感知优化,从而减轻了电流密集型互连的影响。使用电路分区中的层次结构,将布局的自底向上,Pareto前端组合在一起,以探索设计目标之间的权衡关系,从而降低了问题的复杂性。联合微电子公司(United Microelectronics Corporation)130 nm设计过程的模拟电路结构演示了该方法。布局后的仿真表明,对于有效的全自动放置,同时考虑电流和电流密度的重要性。 (C)2016 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号