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Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment

机译:混合流动气体环境下陆栅阵列插座的可靠性评估

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Land grid array (LGA) sockets are used as separable interconnects between printed circuit boards, and high I/O integrated circuit components. Because the socket contacts with the component and the circuit board on both sides, low and stable contact resistances among these interfaces are desirable for the reliable electrical connection of the LGA package. This paper compares the contact resistance degradation of two LGA socket designs, silver particles in an elastomer column, and silver-plated-nickel in an elastomer film, subjected to accelerated corrosion environment, or so-called mixed flowing gases (MFG). Increased contact resistance was observed in the sockets due to corrosion products over the contact surface after metal corrosion. Corrosion products were analysed using environmental scanning electron microscopy (E-SEM), energy dispersive spectroscopy (EDS), and x-ray photoelectron spectroscopy (XPS). AgCl, ${rm Ag}_{2}{rm O}$, and ${rm Ag}_{2}{rm SO}_{4}$ were identified after silver corrosion; ${rm NiCl}_{2}$, ${rm Ni}_{2}{rm SO}_{4}$ , and NiS were found after Ni corrosion. The nickel corrosion product bridged the adjacent contacts as whiskers with time. The lifetime can be estimated by an acceleration factor: two day MFG Battelle Class II exposure equals one year of field service. The shelf life of conductive elastomer LGA sockets is expected to be longer than five years.
机译:焊盘栅格阵列(LGA)插座用作印刷电路板与高级I / O集成电路组件之间的可分离互连。因为插座在两侧都与组件和电路板接触,所以这些接口之间的低而稳定的接触电阻对于LGA封装的可靠电连接是理想的。本文比较了两种LGA插座设计的接触电阻退化,这两种橡胶在弹性体柱中的银颗粒和在弹性体膜中的银镀镍,它们经受了加速腐蚀环境或所谓的混合流动气体(MFG)。在金属腐蚀后,由于接触面上的腐蚀产物,插座中的接触电阻增加。使用环境扫描电子显微镜(E-SEM),能量分散光谱(EDS)和X射线光电子能谱(XPS)分析腐蚀产物。在银腐蚀后鉴定出AgCl,$ {rm Ag} _ {2} {rm O} $和$ {rm Ag} _ {2} {rm SO} _ {4} $。在镍腐蚀后发现$ {rm NiCl} _ {2} $,$ {rm Ni} _ {2} {rm SO} _ {4} $和NiS。镍腐蚀产物会随着时间的流逝将相邻的触点桥接成晶须。可以通过加速因子来估计使用寿命:两天MFG Battelle II级暴露等于一年的现场服务。导电弹性体LGA插座的保质期预计将超过五年。

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