Design & Evaluation Methodology For Built-In-Test

摘要

This paper provides guidelines and procedures to optimize the design of built-in-test (BIT) during the conceptual phase of system design. Optimization of the BIT design is achieved by properly specifying three key design parameters: BIT effectiveness, mean corrective maintenance time, and BIT reliability. These parameters together with the BIT design-to-cost target form the baseline criteria for designing the BIT equipment during subsequent phases. The paper provides straightforward mathematical tools, sensitivity analyses, and tradeoff procedures.