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Study on Ag-Plated Cu Lead Frame and Its Effect to LED Performance Under Thermal Aging

机译:热老化条件下镀银铜引线框架及其对LED性能的影响

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摘要

A systematic study about the effect of thermal aging time on lead frame morphology and LED optical performance was demonstrated in this paper. Three different lead frames for LED manufacturing were chosen to execute thermal aging test for reliability qualification. An evolution about Ag recrystallization, Cu diffusion, Cu nucleation, and growth on lead frame surface was comprehensively explained. The relationship between surface morphology and lead frame reflectance was first established by experimental characterization and comparison. After that, theoretical analysis based on diffusion theory reasonably explained the copper diffusion and nucleation process, which matches well with the morphology changes. Later on, optical simulation on various commercial LED packages was implemented to evaluate the effect of lead frame reflectance on the optical output. In conclusion, centering on Cu diffusion induces reflectance decrease, the connection initializes from thermal aging to final LED lumen performance was successfully built up in this paper. The findings can be directly applied as guidance to facilitate industrial LED manufacturing and reliability qualification.
机译:本文对热老化时间对引线框架形态和LED光学性能的影响进行了系统研究。选择了三种用于LED制造的不同引线框架来执行热老化测试,以进行可靠性鉴定。全面地解释了有关银再结晶,铜扩散,铜成核和在引线框架表面上生长的演变。首先通过实验表征和比较,建立了表面形态与引线框架反射率之间的关系。之后,基于扩散理论的理论分析合理地解释了铜的扩散和成核过程,这与形态变化非常吻合。后来,对各种商用LED封装进行了光学仿真,以评估引线框反射率对光学输出的影响。总之,以铜扩散为中心导致反射率降低,成功建立了从热老化到最终LED流明性能的连接初始化。这些发现可以直接用作指导,以促进工业LED制造和可靠性鉴定。

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