Both long- and short-path delays are used to determine the valid clocking for various complementary metal-organic-semiconductor (CMOS) circuits such as single phase latching, asynchronous, and wave pipelining. Therefore, accurate estimation of both long and short path delays is very crucial in the designing and testing of high speed CMOS circuits. Most of the previous approaches in detecting long and short sensitizable paths assume that the rising and falling of gate delays are either fixed or bounded. In fact the gate delay of CMOS circuits may also depend on how many and which inputs are rising or falling and the arrival times of those rising or falling inputs. For instance, the delay for a two-input CMOS NAND gate may vary as much as a factor of two based on whether one input or two inputs are changing. We shall refer a gate delay model which considers these factors as data dependent delay model. Gray et al. (1992) have proposed an approach based on simulation with event pruning to deal with this type of delay model. In this paper, we propose several algorithms to compute the longest and shortest sensitizable path delays based on a data dependent delay model. A proposed algorithm which is based on a combination of modified static (topological) timing analysis and path sensitization techniques seems to offer the best performance. The results obtained have shown to be more accurate than the traditional path sensitization approach based on bounded delay model.
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