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Bandgap narrowing and emitter efficiency in heavily doped emitter structures revisited

机译:重掺杂发射极结构中的带隙变窄和发射极效率

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The developments of heavy doping effects and of bandgap narrowing (BGN) concepts during the last two decades are critically discussed. The differences between the real bandgap reduction Delta E/sub g/ and the apparent electrical bandgap reduction Delta G are once more set forth, showing the precise meaning of the density-of-states and degeneracy contributions to Delta G. From these concepts, the author indicated previously that for negligible recombination the minority-carrier emitter current (J/sub pe/) is given by a Mertens-type results. It is shown in this work that in the presence of surface and (or) bulk recombination (Auger and SRH) the result of C.R. Selvakumar and D.J. Roulston is recovered; however, the electrical field in the emitter and the effective intrinsic density of carriers are not those used by Selvakumar and Roulston (1987) but, on the contrary, these quantities are given by the detailed expressions of the author's previous work (see A.H. Marshak and C.M. Van Vliet, 1984).
机译:在过去的二十年中,对重掺杂效应和带隙变窄(BGN)概念的发展进行了严格的讨论。再次阐述了实际带隙减小量Delta E / sub g /与表观电气带隙减小量Delta G之间的差异,显示了状态密度和对Delta G的简并贡献的精确含义。作者先前指出,对于可忽略的重组,少数载流子发射极电流(J / sub pe /)由Mertens型结果给出。在这项工作中表明,在存在表面和(或)本体复合(Auger和SRH)的情况下,C.R。Selvakumar和D.J.罗尔斯顿已康复;但是,发射器中的电场和载流子的有效本征密度不是Selvakumar和Roulston(1987)所使用的,相反,这些量由作者先前工作的详细表达给出(参见AH Marshak和CM Van Vliet,1984年)。

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