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Transition Metal Dichalcogenide-Based Field-Effect Transistors for Analog/Mixed- Signal Applications

机译:基于过渡金属硫族化物的场效应晶体管,适用于模拟/混合信号应用

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Transition metal dichalcogenides (TMDs), such as MoS2, MoSe2, MoTe2, WS2, WSe2, etc., have been considered as the most promising candidates for energy-efficient information processing at ultrascaled devices due to their decent energy gap of around 1-2 eV and single-atomic thickness. Even though there are many efforts to explore their performance for digital applications, their performance considerations for analog/mixed-signal applications are still unexplored. In this regard, we have assessed the analog/RF performance of TMD-based field-effect transistors (TMD-FETs) and investigated their benefits over graphene-FET and black phosphorous-FETs. The performance analysis is done by an in-house developed code, which involves the self-consistent solutions of 2-D Poisson's equation and nonequilibrium Green's function (NEGF) formalism. The results show that MoS2-FET can offer high intrinsic gain with the intrinsic cutoff frequency and maximum oscillation frequency in terahertz range. However, the significant degradation in high-frequency performance of MoS2-FET is observed in the presence of external resistances and parasitic capacitances. The cutoff frequency has found a few hundreds of gigahertz range in the presence of all parasitic conditions. It has also found that, among TMD-FETs, WSe2-FET could be a promising candidate for analog/RF integrated circuits with a higher drive current, intrinsic gain, cutoff frequency, and maximum oscillation frequency.
机译:诸如MoS2,MoSe2,MoTe2,WS2,WSe2等的过渡金属二硫化碳(TMD)被认为是超大规模设备中节能信息处理的最有希望的候选者,因为它们的能量差约为1-2 eV和单原子厚度。尽管已经进行了很多努力来探索其在数字应用中的性能,但仍未探索其在模拟/混合信号应用中的性能考虑因素。在这方面,我们评估了基于TMD的场效应晶体管(TMD-FET)的模拟/ RF性能,并研究了它们相对于石墨烯FET和黑磷FET的优势。性能分析是通过内部开发的代码完成的,其中涉及二维Poisson方程和非平衡格林函数(NEGF)形式主义的自洽解。结果表明,MoS2-FET可以以太赫兹范围内的固有截止频率和最大振荡频率提供高固有增益。但是,在存在外部电阻和寄生电容的情况下,观察到MoS2-FET的高频性能明显下降。在存在所有寄生条件的情况下,截止频率已发现数百GHz的范围。还发现,在TMD-FET中,WSe2-FET可能是具有较高驱动电流,固有增益,截止频率和最大振荡频率的模拟/ RF集成电路的有希望的候选者。

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