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High Power Density Performances of SiGe HBT From BiCMOS Technology at W-Band

机译:BiCMOS技术在W波段实现SiGe HBT的高功率密度性能

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In this letter, we report load pull measurements on SiGe HBTs at 94 GHz. Nowadays, this kind of device exhibits $F_{rm MAX}$ above 400 GHz and thus has a growing interest for W-band applications. A load pull test bench is developed for the characterization of this device with special care on architecture and calibration procedure for accurate measurements in 75–110 GHz. The device was characterized under large signal operation showing attractive performance for power amplifier design. A state-of-the-art power density of 18.5 $hbox{mW}/muhbox{m}^{2}$ at 1-dB compression has been obtained at 94 GHz.
机译:在这封信中,我们报告了在94 GHz的SiGe HBT上的负载拉力测量。如今,这种设备在400 GHz以上的频率下具有$ F_ {rm MAX} $,因此对W波段应用越来越感兴趣。开发了一个负载拉力测试台,用于表征该设备,并特别注意架构和校准程序,以在75–110 GHz范围内进行精确测量。该器件的特点是在大信号操作下显示出对功率放大器设计具有吸引力的性能。在94 GHz频率下,以1 dB压缩获得了18.5 $ hbox {mW} / muhbox {m} ^ {2} $的最新功率密度。

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