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Background digital calibration techniques for pipelined ADCs

机译:流水线ADC的背景数字校准技术

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A skip and fill algorithm is developed to digitally self-calibratenpipelined analog-to-digital converters (ADC's) in real time. Thenproposed digital calibration technique is applicable toncapacitor-ratioed multiplying digital-to-analog converters (MDACs)ncommonly used in multistep or pipelined ADCs. This backgroundncalibration process can replace, in effect, a trimming procedure usuallyndone in the factory with a hidden electronic calibration. Unlike othernself-calibration techniques working in the foreground, the proposedntechnique is based on the concept of skipping conversion cycles randomlynbut filling in data later by nonlinear interpolation. This opens up thenfeasibility of digitally implementing calibration hardware andnsimplifying the task of self-calibrating multistep or pipelined ADCs.nThe proposed method improves the performance of the inherently fast ADCsnby maintaining simple system architectures. To measure errors resultingnfrom capacitor mismatch, of amp DC gain, offset, and switch feedthroughnin real time, the calibration test signal is injected in place of theninput signal using a split-reference injection technique. Ultimately,nthe missing signal within two-thirds of the Nyquist bandwidth isnrecovered with 16-b accuracy using a forty-fourth order polynomialninterpolation, behaving essentially as an FIR filter,
机译:开发了一种跳过和填充算法,以实时进行数字自校准流水线式模数转换器(ADC)。然后提出的数字校准技术是适用于通常在多步或流水线ADC中使用的电容电容比乘法数模转换器(MDAC)。该背景校准过程实际上可以用隐藏的电子校准代替工厂中通常的修整程序。与在前台工作的其他自校准技术不同,该技术基于随机跳过转换周期的概念,随后通过非线性插值填充数据。这为数字化实现校准硬件提供了可行性,并简化了多步或流水线ADC的自校准任务。n该方法通过保持简单的系统架构来提高固有快速ADC的性能。为了实时测量由电容器失配引起的误差,安培直流增益,失调和开关馈通,使用分压参考注入技术注入校准测试信号来代替输入信号。最终,使用四十四阶多项式插值法(本质上作为FIR滤波器),无法以16-b的精度恢复奈奎斯特带宽三分之二内的丢失信号,

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