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Anisotropy and critical current density of MgB2 thin films grown in-situ by molecular beam epitaxy

机译:通过分子束外延原位生长的MgB2薄膜的各向异性和临界电流密度

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We report transport properties of superconducting MgB2 thin films in-situ grown by molecular beam epitaxy. The MgB2 films show a superconducting transition at 34.5 K with ΔTc<1 K. We measure the in-plane electrical resistivity of the films in magnetic field to 8 T and estimate the upper critical field Hc2⊥(0)~32 T for field oriented along the c-axis and Hc2||(0)~35 T in the plane of the film. We find the zero-temperature coherence lengths ξc(0)~31 ? and ξab(0)~36 ?, indicating the field anisotropy ratio is 1.2, comparable with reported in-situ epitaxial thin films, but less than single crystals. The calculated electronic mean free path l=25 ? is smaller than the coherence length, which places our films in the dirty limit. Estimates of the critical current density, Jc, using magnetic field hysteresis loops and the Bean critical state model give nominal critical current densities on the order of 106 A/cm2 at 15 K and self-field.
机译:我们报告了分子束外延原位生长的超导MgB2薄膜的传输特性。 MgB2薄膜在34.5 K处出现超导转变,ΔTc<1K。我们测量了薄膜在8 T磁场中的面内电阻率,并估计了场定向的上临界场Hc2⊥(0)〜32 T沿c轴,薄膜平面中的Hc2 ||(0)〜35T。求出零温度相干长度ξc(0)〜31? ξab(0)〜36?和ξab(0)〜36?,表明场各向异性比为1.2,与报道的原位外延薄膜相当,但小于单晶。计算出的电子平均自由程l = 25?小于相干长度,这使我们的胶片处于脏污极限。使用磁场磁滞回线和Bean临界状态模型估算临界电流密度Jc时,在15 K和自电场下,额定临界电流密度约为106 A / cm2。

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