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Tuning carrier density across Dirac point in epitaxial graphene on SiC by corona discharge

机译:通过电晕放电在SiC上外延石墨烯中跨越Dirac点的载流子密度

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摘要

We demonstrate reversible carrier density control across the Dirac point (Δn ∼ 1013 cm−2) in epitaxial graphene on SiC (SiC/G) via high electrostatic potential gating with ions produced by corona discharge. The method is attractive for applications where graphene with a fixed carrier density is needed, such as quantum metrology, and more generally as a simple method of gating 2DEGs formed at semiconductor interfaces and in topological insulators.
机译:我们证明了通过离子的高静电势门控,SiC(SiC / G)上外延石墨烯中Dirac点(Δn〜10 13 cm -2 )上可逆的载流子密度控制由电晕放电产生。该方法对于需要固定载流子密度的石墨烯的应用(例如量子计量学)具有吸引力,并且更普遍地用作对在半导体界面和拓扑绝缘体中形成的2DEG进行门控的简单方法。

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