Electronic structure characterization of La_2NiMnO_6 epitaxial thin films using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy

摘要

Electronic structures of La_2NiMnO_6 epitaxial films are characterized using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy. X-ray absorption spectra reveal that the valence states of Ni~(2+) and Mn~(4+) are dominant. The electronic structure at the valence band maximum is mainly derived from the Mn 3d state. The conduction band minimum is composed mostly of the Mn 3d-O 2p hybridized state. The optical gap is estimated to be about 1.5 eV based on the optical conductivity derived from optical spectra.