PN结二极管散粒噪声测试方法研究

摘要

Because it is hard to detect the Schottky noise in diodes, a method of low-temperature testing for Schottky noise in diodes is proposed. Before testing, UUT is putted into a low-temperature device in the shielding room to restrain the electromagnetic wave and thermal noise. The testing system is composed of the low noise amplifier, adapter and so on. Schottky noise of p-n junction diode was tested by this system. A good result was got.%针对散粒噪声难以测量的特点,提出了一种低温散粒噪声测试方法.在屏蔽环境下,将被测器件置于低温装置内,有效抑制了外界电磁波和热噪声的干扰,采用背景噪声充分低的放大器以及偏置器、适配器等,建立低温散粒噪声测试系统.应用该系统对PN结二极管进行散粒噪声测试,得到了很好的测试结果.