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Metal-semiconductor-metal photodetectors and coplanar transmission lines on SOI for high-speed interconnection.

机译:SOI上的金属-半导体-金属光电探测器和共面传输线,用于高速互连。

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摘要

This thesis studies metal-semiconductor-metal (MSM) photodetectors and coplanar transmission lines (CTL's) on Si-on-insulator (SOI) for gigabit-per-second (Gb/s) data rate optical interconnection. It addresses the challenges and solutions raised from the device design, fabrication and characterization in the hundred gigahertz (GHz) frequency domain.;Part of the work is devoted to improving the speed and sensitivity of Si MSM photodetectors at 0.8 ;Characteristics of CTL's on multilayer substrates expressed in analytical formulas are obtained using conformal mapping. The obtained formulas are then simplified into forms suitable for computer-aided CTL design. The accuracy of these formulas is verified experimentally on a variety of CTL's. To ensure the experimental accuracy, a new technique, differential electro-optic (EO) sampling with a delay-time resolution of 30 fs and a spatial resolution of 1 ;Novel optoelectronic devices based on the polarization effects of transmission gratings and MSM photodetectors, including the first solid-state wavelength detector and linear polarization direction detectors (LPDD's), are achieved through integration of MSM photodetectors and subwavelength gratings.
机译:本文研究了绝缘体上硅(SOI)上的金属-半导体-金属(MSM)光电探测器和共面传输线(CTL),以实现每秒千兆位(Gb / s)数据速率的光学互连。它解决了在百吉赫(GHz)频域中从器件设计,制造和表征引起的挑战和解决方案。部分工作致力于提高Si MSM光电探测器在0.8时的速度和灵敏度;多层CTL的特性分析式中表示的底物是使用保形作图获得的。然后将获得的公式简化为适合计算机辅助CTL设计的形式。这些公式的准确性已在各种CTL上通过实验验证。为确保实验精度,一种新技术是延迟时间分辨率为30 fs,空间分辨率为1的差分电光(EO)采样;基于透射光栅和MSM光电探测器的偏振效应的新型光电器件,包括第一个固态波长检测器和线性偏振方向检测器(LPDD)是通过集成MSM光电检测器和亚波长光栅实现的。

著录项

  • 作者

    Chen, Erli.;

  • 作者单位

    University of Minnesota.;

  • 授予单位 University of Minnesota.;
  • 学科 Engineering Civil.
  • 学位 Ph.D.
  • 年度 1997
  • 页码 139 p.
  • 总页数 139
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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