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Investigation ofp-n junction inductors for RF CMOS circuits.

机译:用于RF CMOS电路的p-n结电感的研究。

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摘要

Inductors are crucial elements for high performance RF circuits. In this dissertation, we investigate the p-n junction inductors utilizing interband tunneling and avalanche mechanism to generate inductive effects. Compared to passive inductor, the higher quality factor (Q) for the p-n junction inductor can be attained. Due to this p-n junction inductance coming from the mixed tunneling and avalanche mechanism, the Q and noise performance is a tradeoff problem. Consequently, the Si bandstructure, the tunneling generation rate and the avalanche generation rate were probed to attain the design concepts for the p-n junction inductor. The mixed tunneling and avalanche effect complicates the inductor design for the high Q and low noise. In this research work, one new method to unravel these two effects with non-local effects involved was successfully developed for the first time since 1950's. The tunneling generation rate characteristics extracted from this new method showed the individual indirect tunneling and direct tunneling rate for the first time. This tunneling generation rate is consistent with the other results after adding our new extracted avalanche multiplication factor to our new extracted tunneling generation rate.; The tunneling generation rate and avalanche multiplication factor is applicable to design the high performance of the p-n junction inductor. A 2.4 GHz LNA with the p-n junction inductor in 0.35 mum CMOS were presented in this research. The first stage of the proposed two stage LNA provides input matching, low noise and sufficient gain to suppress the noise from the second stage. The second stage with the high Q of the p-n junction inductor provides enough gain. The two stage LNA with this new design p-n junction inductor has 2.83 dB noise figure and 23.32 dB gain.
机译:电感器是高性能RF电路的关键元件。本文研究了利用带间隧穿和雪崩机制产生感应效应的p-n结电感。与无源电感器相比,p-n结电感器可以获得更高的品质因数(Q)。由于此p-n结电感来自混合隧穿和雪崩机制,因此Q和噪声性能是一个权衡问题。因此,探究了硅的能带结构,隧穿发生率和雪崩发生率,从而获得了p-n结电感的设计思想。混合隧穿和雪崩效应使高Q和低噪声的电感器设计复杂化。在这项研究工作中,自1950年代以来首次成功开发了一种新方法来解开涉及非局部效应的这两种效应。从这种新方法中提取的隧穿发生率特性首次显示了单独的间接隧穿和直接隧穿率。将新提取的雪崩倍增因子添加到新提取的隧道产生速率后,该隧穿生成速率与其他结果一致。隧穿产生速率和雪崩倍增系数可用于设计p-n结电感的高性能。这项研究提出了在0.35um CMOS中具有p-n结电感的2.4 GHz LNA。所提出的两级LNA的第一级提供输入匹配,低噪声和足够的增益以抑制来自第二级的噪声。 p-n结电感的高Q的第二级提供足够的增益。采用这种新设计的p-n结电感的两级LNA具有2.83 dB的噪声系数和23.32 dB的增益。

著录项

  • 作者

    Lee, Chie-In.;

  • 作者单位

    University of California, Los Angeles.;

  • 授予单位 University of California, Los Angeles.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 105 p.
  • 总页数 105
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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