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Fabrication of p-type La: Fe_2O_3 as photocathode via atomic layer deposition

机译:通过原子层沉积制备P型La:Fe_2O_3作为光电阴极

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P-type La:Fe_2O_3 and the n-p junction of Fe_2O_3/La:Fe_2O_3 have been fabricated by ALD technique for its excellent conformability and controllable film growth with low defect densities. La: Fe_2O_3 film is demonstrated withp-type characteristics by Mott-Schottky plots and the hole concentration is calculated ~ 1.97 × 10~(15) cm~(-3). It also obtains a cathodic photocurrent of ~28 μA/cm~2 at -0.8 V vs. Ag/AgCl. When forming the n-p junction of Fe_2O_3/La: Fe_2O_3, it is found that the onset potential exhibits a negative shift of ~150 mV and the photocurrent densities increases from 0.62 mA/cm~2 to 1.31 mA/cm~2 at 0.5 V vs. Ag/AgCl. Generally, the incident photon-to-current conversion efficiency (IPCE) of Fe_2O_3/La:Fe_2O_3 n-p junction reaches ~4.47% at 400 nm. Our results imply that it is desirable to tune the energy mismatch between water splitting potentials and the band edges of Fe_2O_3 by a facile surface modification by forming a solid n-p junction.
机译:P型La:Fe_2O_3和Fe_2O_3 / LA:Fe_2O_3的N-P结是由ALD技术制造的,用于其具有低缺陷密度的优异形式和可控薄膜生长。 LA:Fe_2O_3薄膜通过Mott-Schottky地图证明了用P型特性,并且孔浓度计算〜1.97×10〜(15)cm〜(3)。它还获得-0.8V与Ag / AgCl的阴极光电流〜28μA/ cm〜2的阴极光电流。当形成Fe_2O_3 / LA:Fe_2O_3的NP结时,发现发病电位表现出〜150mV的负偏移,光电流密度从0.62mA / cm〜2增加0.5V VS时增加0.62 mA / cm〜2至1.31mA / cm〜2 。AG / AGCL。通常,Fe_2O_3 / LA的事件光子到电流转化效率(IPCE):Fe_2O_3 N-P结达400nm的〜4.47%。我们的结果暗示通过形成固体N-P结来调谐水分裂电位和Fe_2O_3的带边的能量不匹配。

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