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Advances in MBE Selective Area Growth of III-Nitride Nanostructures: From NanoLEDs to Pseudo Substrates

机译:III-氮化物纳米结构的MBE选择性面积生长研究进展:从纳米升降到伪衬底

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The aim of this work is to provide an overview on the recent advances in the selective area growth (SAG) of (In)GaN nanostructures by plasma assisted molecular beam epitaxy, focusing on their potential as building blocks for next generation LEDs. The first three sections deal with the basic growth mechanisms of GaN SAG and the emission control in the entire ultraviolet to infrared range, including approaches for white light emission, using InGaN disks and thick segments on axial nanocolumns. SAG of axial nanostructures is developed on both GaN/sapphire templates and GaN-buffered Si(111). As an alternative to axial nanocolumns, section 4 reports on the growth and characterization of InGaN/GaN core-shell structures on an ordered array of top-down patterned GaN microrods. Finally, section 5 reports on the SAG of GaN, with and without InGaN insertion, on semi-polar (11-22) and non-polar (11-20) templates. Upon SAG the high defect density present in the templates is strongly reduced as indicated by a dramatic improvement of the optical properties. In the case of SAG on non-polar (11-22) templates, the formation of nanostructures with a low aspect ratio took place allowing for the fabrication of high-quality, non-polar GaN pseudo-templates by coalescence of these nanostructures.
机译:这项工作的目的是概述(In)GaN纳米结构的最近进步的概述通过等离子体辅助分子束外延,重点关注其作为下一代LED的构建块的潜力。前三个部分处理GaN SAG的基本生长机制和整个紫外线的排放控制,包括白色光发射的方法,使用IngaN磁盘和轴向纳米柱的厚片。轴向纳米结构的凹陷是在GaN / Sapphire模板和GaN缓冲Si(111)上开发的。作为轴向纳米柱的替代方案,第4节报告了InGaN / GaN核心 - 壳结构的增长和表征在上下图案的甘微孔的有序阵列上的增长和表征。最后,第5节关于GaN的凹陷,在半极性(11-22)和非极性(11-20)模板上的插入和没有Incan插入的报告。在SAG时,模板中存在的高缺陷密度大大减少,如光学性质的显着改善所示。在非极性(11-22)模板上的凹陷的情况下,发生具有低纵横比的纳米结构的形成,允许通过这些纳米结构的聚结制造高质量的非极性GaN伪模板。

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