首页> 外文期刊>International Journal of High Speed Electronics and Systems: Devices, Integrated Circuits and Systems, Optical and Quantum Electronics >Advances in MBE Selective Area Growth of III-Nitride Nanostructures: From NanoLEDs to Pseudo Substrates
【24h】

Advances in MBE Selective Area Growth of III-Nitride Nanostructures: From NanoLEDs to Pseudo Substrates

机译:III型氮化物纳米结构MBE选择性区域生长的进展:从NanoLEDs到伪衬底

获取原文
获取原文并翻译 | 示例
           

摘要

The aim of this work is to provide an overview on the recent advances in the selective area growth (SAG) of (In)GaN nanostructures by plasma assisted molecular beam epitaxy, focusing on their potential as building blocks for next generation LEDs. The first three sections deal with the basic growth mechanisms of GaN SAG and the emission control in the entire ultraviolet to infrared range, including approaches for white light emission, using InGaN disks and thick segments on axial nanocolumns. SAG of axial nanostructures is developed on both GaN/sapphire templates and GaN-buffered Si(111). As an alternative to axial nanocolumns, section 4 reports on the growth and characterization of InGaN/GaN core-shell structures on an ordered array of top-down patterned GaN microrods. Finally, section 5 reports on the SAG of GaN, with and without InGaN insertion, on semi-polar (11-22) and non-polar (11-20) templates. Upon SAG the high defect density present in the templates is strongly reduced as indicated by a dramatic improvement of the optical properties. In the case of SAG on nonpolar (11-22) templates, the formation of nanostructures with a low aspect ratio took place allowing for the fabrication of high-quality, non-polar GaN pseudo-templates by coalescence of these nanostructures.
机译:这项工作的目的是概述通过等离子辅助分子束外延生长(In)GaN纳米结构的选择性区域生长(SAG)的最新进展,重点是它们作为下一代LED的基础材料的潜力。前三个部分介绍了GaN SAG的基本生长机理以及在整个紫外到红外范围内的发射控制,包括使用InGaN盘和轴向纳米柱上的厚段的白光发射方法。在GaN /蓝宝石模板和GaN缓冲的Si(111)上都开发了轴向纳米结构的SAG。作为轴向纳米柱的替代方法,第4部分报告了自上而下的图案化GaN微棒的有序阵列上InGaN / GaN核-壳结构的生长和表征。最后,第5节报告了在半极性(11-22)和非极性(11-20)模板上插入和不插入InGaN的GaN SAG。在SAG上,模板中存在的高缺陷密度会大大降低,如光学性能的显着改善所表明的。在非极性(11-22)模板上的SAG情况下,形成了具有低纵横比的纳米结构,从而可以通过这些纳米结构的聚结来制造高质量的非极性GaN伪模板。

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号