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Impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFETs

机译:门错入对掺杂剂隔离肖特基屏障MOSFET的影响

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The impact of gate misalignment on the performance of dopant-segregated Schottky Barrier MOSFET (DS SBTs) and on the carrier transport is investigated by Monte Carlo method. The simulation results show that gate misalignment with dopant-segregated structure (DSS) has less significant impact on drain current than that without DSS. The influence of gate misalignment with DSS becomes notable only when drain voltage is high enough, while gate misalignment without DSS affects drain current always no matter how much drain voltage is. For carrier transport, our results demonstrate that maximal velocity at source side of DS SBTs without gate misalignment shows saturation, while saturation doesn’t exist in DS SBTs with gate misalignment.
机译:通过蒙特卡罗方法研究了栅极未对流对掺杂剂隔离肖特基屏障MOSFET(DSSBTS)和载体传输性能的影响。仿真结果表明,具有掺杂剂隔离结构(DSS)的浇口未对准对漏极电流的影响较小,而不是没有DSS。只有在漏极电压足够高时,栅极未对准的影响变得显着,而没有DSS的栅极未对准始终会始终影响漏极电流。对于载波传输,我们的结果表明,DS SBT源侧的最大速度,没有栅极错位显示饱和度,而DS SBT的饱和度不存在,具有栅极未对准。

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