首页> 外文会议>NATO Advanced Research Workshop on Nanoscaled Semiconductor-on-Insulator Structures and Devices >Three-Dimensional (3-D) Analytical Modeling of the Threshold Voltage, DIBL and Subthreshold Swing of Cylindrical Gate all Around Mosfets
【24h】

Three-Dimensional (3-D) Analytical Modeling of the Threshold Voltage, DIBL and Subthreshold Swing of Cylindrical Gate all Around Mosfets

机译:阈值电压的三维(3-D)分析建模,DIBL和Qualtical围绕MOSFET的圆柱形栅极的摆动

获取原文

摘要

We present 3-D analytical, scalable models for the threshold voltage roll-off, the subthreshold swing and the DIBL of undoped cylindrical Gate All Around (GAA) MOSFETs. The models are based on an analytical solution of the 3-D Poisson equation. Device geometry dependences are inherent to the models. Excellent agreement has been obtained with 3-D numerical simulations and experimental results.
机译:我们为阈值电压滚降提供3-D分析,可伸缩模型,亚阈值摆动和外部未掺杂的圆柱栅极(GaA)MOSFET的底栅。该模型基于3-D泊松方程的分析解决方案。设备几何依赖性是模型所固有的。使用3-D数值模拟和实验结果获得了良好的一致性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号