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Analysis of Mechanical Strength for Flip-chip Bonding of GaAs MMIC

机译:GaAs MMIC倒装芯片粘接机械强度分析

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Increased packaging demands in wireless communications, and military electronics has led to the use of flip-chips for RF and microwave applications. For a reliable bonding of flip-chip interconnection, proper knowledge of bonding parameters and bonding ability to different substrates is important. This paper depicts a comparative analysis of flip-chip bonding of GaAs MMIC (Monolithic Microwave Integrated Circuit) to thick/thin film metallization on ceramic substrates (hereinafter thick-film and thin-film), and organic substrates using Anisotropic Conductive Film (ACF), Thermo-compression (TC) bonding methods with different bonding parameters. The results from the optimization study of the parameter settings for mechanical reliability of ACF and TC with different substrates are presented.
机译:增加无线通信的包装需求,军用电子设备导致了用于RF和微波应用的翻转芯片。对于倒装芯片互连的可靠键合,对不同基材的粘合参数和粘合能力的正确了解是重要的。本文描绘了使用各向异性导电膜(ACF)的陶瓷基板(下文中厚膜和薄膜)上的GaAs MMIC(单片微波集成电路)对厚/薄膜金属化的倒装/薄膜金属化的比较分析,以及使用各向异性导电膜(ACF) ,具有不同粘合参数的热压缩(TC)粘合方法。提出了ACF和TC与不同基板的机械可靠性参数设置的优化研究的结果。

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